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Pharos Probe
  • Pharos Probe
  • Pharos Probe

The Pharos™ Probe Series from FormFactor revolutionizes wafer-level photonics testing, providing both low-loss edge coupling and enhanced surface coupling for Silicon Photonics (SiPh) applications. With multiple versions—Pharos™ Edge Short Lens, Long Lens, and Vertical—this series offers precision, automation, and flexibility to meet the demands from engineering to high-volume production environments with high-precision optical measurements.

Designed to support industries such as data centers, wearables, AI, and LiDAR, Pharos probes ensure accurate, reliable testing for optical transceivers, sensors, and optical interconnects. Paired with FormFactor’s SiPh-Tools 4.0, which includes AutoCal and the Autonomous Silicon Photonics Assistant, the series offers automated calibration that streamlines setup, enabling even inexperienced users to perform complex tests with ease.

  • Three Versatile Versions:
    • Short Lens: Perfect for wafer level trenches with shorter trench depths and working distances.
    • Long Lens: Designed for wafer level V-grooves with deeper trenches and longer working distances.
    • Vertical Version: Optimized for vertical/grating coupler coupling applications, offering versatility across this wafer-level photonics technique.
  • Low-Loss Edge Coupling:
    The Pharos-Edge™ Short and Long Lens ensures low-loss coupling for wafer-level trenches and V-grooves, providing high-precision optical measurements that are crucial for Silicon Photonics testing.
  • Automated Calibration with AutoCal:
    Integrated with SiPh-Tools 4.0, the AutoCal feature simplifies the calibration process, offering faster setup and reducing the need for manual adjustments. This results in improved throughput and lower operational costs.
  • Patented Fiducial and Lens Technology:
    FormFactor’s unique optical fiducial and lens design provide accurate positioning and reliable results with minimal user interaction, ensuring repeatable and precise measurements.