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ACP-Q Probe
  • ACP-Q Probe

Quadrant Probes were developed in response to the need for multiple probe tips in a single module. Configurations consist of all RF or a combination of RF and DC. The RF probes use Air Coplanar technology to produce a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer. The DC probes use ceramic blade needles for low noise and high performance. The ACP Quadrant Probes are customizable to fit your specific needs.

40/80 Gb/s High Performance RF Quadrant

Designed to provide wide bandwidth RF connections and simultaneous resonant free power bypass connections for the special needs of high-speed mixed mode IC s for optical networks.

  • Low RF loss and excellent impedance control over very wide bandwidth
  • High performance resonance free bypass for low impedance power supplies
  • Allows on-wafer evaluation of high performance digital circuits
  • Minimal distortion of high-speed digital signals
  • Maximized eye diagram test performance at wafer test
  • Durable Air Coplanar tip technology for long contact life

  • Combination of DC and RF in a single probe module: One dual probe or a maximum of three RF; a maximum of 9 DC standard (other quantities upon request).
  • Utilizes ACP tip design, GSG, GS or SG
  • RF tips available from DC to 110 GHz
  • Choice of BeCu or tungsten tips
  • DC power needles come standard with 100 pF microwave capacitor
  • Power bypass inductance: 8 nH
  • Maximum DC voltage: 50 V without power bypassing (25 V with standard power bypassing, and component dependent with custom power bypassing)
  • Ideal for probing the entire circuit for functional test
  • Dual ACP configuration supports differential signaling applications
  • DC probes can provide power or slow logic to circuit under test