Pyramid Parametric Probe Cards with Low Leakage

Product Overview

The Parametric series Pyramid probe cards are the high performance, low-cost alternative to the existing solutions, compatible with all major parametric tester platforms, and designed to enable the accurate monitoring of 65 nm and 45 nm parametric test structures. FormFactor’s innovative PyramidPlus™ manufacturing process ensures a substantially lower cost of ownership, while delivering superior signal integrity and faster settling time, compared to traditional probe technologies. The Parametric series Pyramid Probe card is ideal for applications such as final process development, DC-only parametric volume production (in-line and end-of-line), and Wafer-Acceptance Testing (WAT).

Key Features

Guarded traces to probe tips with lowest leakage
Excellent measurement fidelity with low leakage (1 fA/V), fast settling time, and reduced cross talk
One card for both Cu and Al pads probing
Small-pad probing down to 30×30 µm
Low cost of ownership, superior signal integrity and fast settling time enabled by PyramidPlus manufacturing technology

Downloads

For cleaning and product-specific information visit the Pyramid probe card support page.

PDC50 Pyramid Probe Card Data Sheet

Pyramid Probes - Parametric PCB Cleaning

Pyramid Probe Card Training Flyer

Advanced Wafer Probe Cards - Brochure