FormFactor Selected by Tera Probe as Strategic Wafer Test Solution Provider
October 18, 2005
October 18, 2005
Major Wafer Testing Service Choses FormFactor KGD Technology Wafer Probe Solution
LIVERMORE, Calif. – Oct. 18, 2005 – FormFactor, Inc. (Nasdaq: FORM), a leading provider of advanced wafer probe cards, today announced that Tera Probe Inc. has chosen FormFactor as its strategic partner for wafer probe card technology. Tera Probe, a testing service venture formed by Advantest Corporation, Kingston Technology, Powertech and Elpida Memory, Japan’s leading global supplier of dynamic random access memory (DRAM), brings together its founders’ respective test equipment, assembly and testing services, memory products and wafer technology – and now FormFactor wafer probe solutions – to serve Elpida and other semiconductor manufacturers.
Shrinking consumer electronics such as cellular phones and mobile devices continue to demand greater performance from smaller system packages and, as a result, device manufacturers face mounting package production costs coupled with the need for more test insertions to assess complex function. A major cost factor in system packages is the time and costs to package and test die that are ultimately identified as “bad.” Wafer-level final test prior to packaging verifies known good die (KGD), and is emerging as an important strategy for maximizing yield, cutting costs and minimizing revenue loss due to flawed components that cause package failure. Tera Probe is adopting KGD test for mobile memory devices targeting the burgeoning consumer electronics memory segment.
“FormFactor offers the industry’s only comprehensive KGD solution and was clearly the right choice for our wafer probing requirements,” said Masahide Ozawa, president, Tera Probe. “Not only does FormFactor share our vision for KGD, its proven products and its commitment to further enhancements of KGD-yielding technology promise the lowest risk for us as we put our strategy into action.”
FormFactor introduced UPstream, its wafer-level burn-in test solution, at the KGD Packaging and Test Workshop in September. The new product rounds out FormFactor’s suite of advanced technology including, wafer sort and at-speed test products comprising its total solution for KGD test.
“Tera Probe’s selection of FormFactor as its strategic supplier underscores the value of our technology innovation and world-class production capabilities,” said Joe Bronson, president, FormFactor. “FormFactor solutions will give Tera Probe a crucial advantage in meeting market demand. When it comes to delivery, our use of cutting-edge micro-electro-mechanical systems (MEMS) technology and ability to scale production will ensure Tera Probe the support they need to operate as a global test services provider.”