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The Digital Revolution: NRZ to PAM4

With increasing demand to process more data and pass large amounts of data through servers, cellular devices, and even within the computer for the highest performing video cards, the need for more complex digital processing is becoming greater than ever. In this presentation, Daniel Bock and David Raschko will show some of the impacts of NRZ compared to PAM4 on wafer test through example probe cards and describe the changing test requirements.

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