Test Setup Optimization and Automation for Accurate Silicon Photonics Wafer Acceptance Production Tests
FormFactor’s Dr Choon Beng Sia with co-authors from GLOBALFOUNDRIES Singapore, present a technical paper on production testing of Silicon Photonics wafers at the 33rd IEEE International Conference on Microelectronic Test Structures (ICMTS). In the paper, they demonstrate incident angle optimization for optical wafer tests as well as evaluation of a fully automatic SiPh wafer test architecture that is accurate and dependable.
Created: June 3, 2020 | Updated: June 3, 2020 | Type: pdf | Size: 1.39 MB