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Single Sweep Broadband S-Parameter Measurements to mm-Wave for Semiconductor Transistor and IC Test to 220 GHz

Measurements beyond conventional coaxial limits often means more frequent changes to the banded setup. For some time there have been requests to enable measurements to go all the way to 220 GHz in a single sweep with performance levels equivalent to conventional coaxial approaches. In this presentation we will show the new optimized single sweep solution with some initial measurements. We will also present typical analytical approaches to evaluate the performance of the system using python and WinCal. We will also show the new storage pod design to enable quick and safe band swaps if needed beyond 220 GHz.

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