Productivity Innovations for Automotive IC Wafer Test

Amy Leong, FormFactor CMO, presented at Semicon West 2018, "Productivity Innovations for Automotive IC Wafer Test." The presentation outlines trends and challenges in automotive IC production, and describes various ways FormFactor products help to improve test productivity from the lab to the fab. The presentation includes two case studies: 1) on LIDAR wafer test and 2) on automotive microcontroller probing in a production environment.

Created: July 11, 2018 | Updated: July 11, 2018 | Type: pdf | Size: 3.31 MB

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