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Narrow Pitch Impedance Standard Substrates (ISS) for Pyramid Probe Applications

The growth of Large Language Models (LLMs) like ChatGPT, BING AI, and Google BARD/Gemini has led to a rapid increase in demand for faster and more efficient optical communication. To meet this need, operating frequencies and bandwidths must increase, driving demand for more integrated and compact solutions. This manifests in the need for higher data rates in IO devices (such as transimpedance amplifiers (TIAs), laser diodes, etc.) to enable real-time communication, ensure scalability, and improve system efficiency and performance, thereby making higher data rates essential to meeting the evolving demands of applications driven by LLMs. To ensure high DUT yield, wafer tests at >=60 GHz are essential to validate IO devices capable of achieving these higher data rates. Pyramid Probes provide high-quality device under test (DUT) characterization in wafer tests beyond 67 GHz in high-volume manufacturing (HVM) environments, making them an ideal solution for this need. As DUT size decreases, pitch follows suit, with a drive to pitches <100 um. These narrow pitches provide various advantages such as a reduction in parasitic capacitance and inductance and enable increased device density necessary for advanced packaging technologies solutions. In this paper, we will discuss the impact of narrower pitches and smaller pad dimensions on DUT characterization in the context of ISSs. We will review the challenges of signal coupling and signal crosstalk that affect signal integrity, and other strategies for reducing calibration standards sizes and their impacts on various calibration methods.

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