High-Power Probes Data Sheet

FormFactor's high-power probes provide a complete on-wafer solution for over-temperature, low-contact resistance measurements of power semiconductors. Together with Tesla on-wafer power device characterization system, FormFactor’s high-power probes achieve reliable and repeatable on-wafer measurements up to 300 A and 10,000 V.

- High-Power Probes Data Sheet

Created: August 16, 2017 | Updated: February 16, 2023 | Type: pdf | Size: 855.36 KB