July 2, 2024
Our scalable solution adapts as your requirements evolve. When throughput demands increase, you can upgrade to a fully automated system by docking an optional wafer-handling robot, specifically designed for the PA210 BlueRay, directly in the field.
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June 20, 2024
FormFactor is pleased to announce that new Velox Dash Companion Device for the operation of probe stations. Velox Dash is FormFactor’s new companion app, designed to enhance probe station control through a modern, tablet-based interface.
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February 16, 2024
The TESLA300 facilitates the gathering of precise data on high voltage and high current measurements, ensuring total safety for operators. It supports testing on both individual and volume-thinned wafers for R&D, device characterization/modeling, and specialized production with maximum efficiency.
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November 17, 2023
Ensuring accurate and repeatable DC parametric measurements (IV, CV, pulsed, and high-power) is paramount in reducing uncertainty. Dependable results expedite device qualification, generating more precise models and design toolkits.
Read MoreOctober 5, 2023
Delivering Advanced mm-Wave Load-Pull Measurements | READ MORE
July 27, 2023
TESLA200 and TESLA300 Probe Systems – Tackling High-Voltage Measurement Data | READ MORE
June 8, 2023
The IMS-K-Cryo-LFN: Cryogenic Ultra Low Noise Probe System | READ MORE
April 6, 2023
New IceShield Solution for CM300xi Probe Station | READ MORE
March 9, 2023
6 CM300xi-ULN Probe System Components that Leverage PureLine Technology | READ MORE
September 30, 2022
New Velox 3.3 Probe Station Control Software Features | READ MORE
July 1, 2022
Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures | READ MORE
March 3, 2022
High-Power Semiconductor Wafer Probing System for Automotive, Renewable Energy, and Industrial Applications | READ MORE
February 17, 2022
Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations | READ MORE
September 16, 2021
New Velox Software Release – New Enhancements for Version 3.2.1 | READ MORE
July 29, 2021
Eliminating 97% of Prober Environment Noise with PureLine 3 Technology | READ MORE
July 21, 2021
On-Demand Webinar: Advances in Analytical Wafer Probing of High-voltage/High-current Devices | READ MORE
July 1, 2021
15% Discount on 150 mm Probe Station Accessories – Check it Out! | READ MORE
June 24, 2021
New Automated Cryogenic Wafer Probe System to Enable Superconducting Compute Applications | READ MORE
June 17, 2021
The Gold Standard for On-Wafer Noise Testing – The CM300xi-ULN Probe Station | READ MORE
June 9, 2021
New Webinar – Advances in Analytical Wafer Probing of High-Voltage/High-Current Devices | READ MORE
May 4, 2021
NEW: Semiconductor Test and Measurement Webinar Series – Register Now | READ MORE
April 9, 2021
New Integrated Measurement Systems from FormFactor and Keysight Technologies | READ MORE
April 2, 2021
OptoVue Pro – Enhanced Photonics Probing Calibration Now Available for the SUMMIT200 Probe Station | READ MORE
March 12, 2021
Now Available: Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations | READ MORE
February 18, 2021
Introducing Velox 3.2 Probe Station Control Software | READ MORE
February 11, 2021
Autonomous RF Delivers Remote Probing from Anywhere | READ MORE
February 5, 2021
Testing VCSEL Devices On-Wafer | READ MORE
November 10, 2020
New Webinar – Low Frequency Noise on December 8: Register Now | READ MORE
November 5, 2020
CM300xi-ULN Probe Station – Eliminating Deployment Issues by Picking the Ideal Location | READ MORE
October 16, 2020
Achieving High Throughput 1/f, RTN Noise Measurements | READ MORE
September 17, 2020
PureLine 3 Technology Eliminates 97% of Prober Environment Noise | READ MORE
September 3, 2020
New Gold Standard for On-Wafer Noise Testing – The CM300xi-ULN Probe Station | READ MORE
August 27, 2020
SourceOne – A Great Way to Upgrade Your Semiconductor Test Equipment | READ MORE
June 26, 2020
Introducing the CM300xi-ULN for Flicker Noise (1/f), Random Telegraph Noise (RTN) and Phase Noise Measurements of Ultra-Sensitive Devices | READ MORE
June 11, 2020
New Velox Software Release: 5 New Enhancements in Velox 3.1 Probe Station Control Software | READ MORE
May 28, 2020
Autonomous SiPh Measurement Assistant Delivers Thermal Capability Second to None | READ MORE
May 21, 2020
New Thermal System with Reduced Air Consumption Delivers Best Cost-Performance | READ MORE
May 14, 2020
Probing from Home – Autonomous RF Delivers | READ MORE
May 5, 2020
Working from Home? Meet Our Application Specialists in Our Virtual Demo Lab | READ MORE
April 30, 2020
Cryogenic Wafer Testing is Heating Up | READ MORE
April 23, 2020
Edge Coupling Efficiencies for Wafer and Die Level Applications | READ MORE
April 7, 2020
3D Manual Controls – Making Manual Adjustments on Automated CM300xi Probe Stations | READ MORE
March 27, 2020
OptoVue Pro – Faster Time to Data with Real-Time In-Situ Calibration | READ MORE
March 24, 2020
3 Probe System Upgrade Packages That Take Your Test Capabilities to the Next Level | READ MORE
March 12, 2020
New Edge Coupling Probe Solutions for Silicon Photonics (SiPh) Devices | READ MORE
March 6, 2020
6 Reasons Why Probe Systems Service Agreements Make Sense | READ MORE
February 20, 2020
Advanced mm-Wave and Terahertz Measurements – Enhanced with Autonomous RF Measurement Assistant | READ MORE
January 30, 2020
The PAC200 Probe Station for Cryogenic Probing Environments | READ MORE
January 23, 2020
Velox 3 Probe Station Control Software – Feature Videos | READ MORE
December 12, 2019
Genius Education Kits – Turnkey S-parameter Measurement Systems for RF and Microwave Test | READ MORE
November 5, 2019
Customize a 150 mm Modular Probe Station Starting at $13,880 | READ MORE
November 1, 2019
Experience the All New Velox 3 Probe Station Control Software | READ MORE
October 24, 2019
New Integrated, Automated Probe Solution for Wafer-level Characterization of 5G Devices and Circuits | READ MORE
October 10, 2019
DC, RF and Optical Probe Positioners for the Highest Accuracy Measurements | READ MORE
September 19, 2019
Advanced mm-Wave and Terahertz Measurements on FormFactor Probe Stations – New Solution and 4 Great Features | READ MORE
August 23, 2019
VueTrack vs. ReAlign – Two Innovative Velox Tools for Unattended Testing Over Time and At Multiple Temperatures | READ MORE
August 15, 2019
TESLA200 – 200mm Power Semiconductor Probe Station | READ MORE
August 8, 2019
CM300xi Probe System – Delivering Measurement Accuracy and Reliability | READ MORE
August 1, 2019
6 Benefits of the New Velox 2.6 Probe Station Control Software Suite | READ MORE
July 18, 2019
Introducing the RFgenius On-Wafer S-Parameter Measurement Package | READ MORE
July 11, 2019
Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures | READ MORE
May 23, 2019
3 Tips to Getting the Most from WinCalXE Probe Calibration Software | READ MORE
March 28, 2019
5 Benefits of the EPS200MMW Dedicated Probe System | READ MORE
March 22, 2019
The EPS150FA Probe System – At Work in the Brown University Lab | READ MORE
February 21, 2019
Spotlight on MeasureOne Cryogenic Probing Solutions | READ MORE
January 17, 2019
5 Ways the EPS150RF and EPS200RF Probe Stations Deliver Accurate Measurement Results – Part Two | READ MORE
January 11, 2019
5 Ways the EPS150RF and EPS200RF Probe Stations Deliver Accurate Measurement Results – Part One | READ MORE
November 16, 2018
4 Wafer-Level Test Solutions for IR Sensors | READ MORE
October 18, 2018
High-Voltage and High-Current Probing with Safety in Mind | READ MORE
September 20, 2018
In the University Lab: Exploring the Outer Limits of High-Frequency CMOS Circuitry | READ MORE
September 13, 2018
Cryogenic Probe Systems: The PLC50 Laboratory Probing Solution | READ MORE
August 30, 2018
In the University Lab with the EPS150FA Probe System | READ MORE
July 26, 2018
CM300xi – Enabling Automation While Compressing Cycle Times | READ MORE
July 12, 2018
Five Benefits of the New TESLA200 High-Power Semiconductor Probing System | READ MORE
July 9, 2018
Contact Intelligence for RF Probe Systems Raises the Bar | READ MORE
June 28, 2018
The EPS150RF Probe Station and Infinity Probe – Exploring High-Frequency CMOS Circuitry | READ MORE
June 21, 2018
Used Fab Equipment – Two Lessons from the Trenches | READ MORE
June 14, 2018
Four Ways the Estrada™ Probe System for Electromigration Delivers Success | READ MORE
June 7, 2018
Removing the Risk When Buying Used Fab Equipment | READ MORE
May 3, 2018
CM300xi Wafer Probe Station with Contact Intelligence Aids High-Volume Engineering | READ MORE
April 26, 2018
EM PLR and EM WLR Data Prove Interchangeable | READ MORE
March 29, 2018
Accurate Wafer-Level Testing Across Extended Temperature Ranges | READ MORE
February 1, 2018
Three Requirements of Successful Electromigration Wafer-Level Testing | READ MORE
December 7, 2017
Transforming 300 mm Probing with Contact Intelligence Technology | READ MORE