February 21, 2025
As semiconductor devices grow more complex, ensuring that each component functions correctly before integration is essential. With multi-chiplet architectures becoming standard, Known Good Die (KGD) testing plays a key role in improving final yield and reducing costs.
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July 31, 2024
The ReAlign wizard facilitates easy and quick setup with predefined algorithms for various probe cards, including Pyramid, Apollo, and Cantilever. ReAlign can also automatically manage temperature transitions without requiring operator intervention.
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April 26, 2024
The Senior Principal Engineer discusses why CCC matters, reviews a hybrid probe configuration, introduces the next generation probe that FormFactor is introducing, reviews the metallized guide plate, and looks at different configurations and how they maximized the CCC.
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January 26, 2024
The demand for cost-effective performance in high-end applications, such as data centers, artificial intelligence, autonomous vehicles, and hyper-realistic graphics, has led to the integration of multiple dies into monolithic systems.
Read MoreJanuary 12, 2024
What is MEMS? | READ MORE
December 8, 2022
Removing Probing Debris from Springs Used for DRAM and FLASH Applications | READ MORE
September 1, 2022
3 Recommended Abrasive Cleaning Media for Online Pyramid Probe Cleaning | READ MORE
July 14, 2022
Test Vision Symposium Presentations Now Available | READ MORE
July 8, 2022
FormFactor Ranked the Number One Supplier of Semiconductor Probe Cards | READ MORE
May 5, 2022
Probe Card Cleaning 101 – Protecting Your Probe Card Investment | READ MORE
February 17, 2022
Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations | READ MORE
November 18, 2021
3 Recommended Abrasive Cleaning Media for Online Pyramid Probe Cleaning | READ MORE
September 9, 2021
Expanding Large Area Arrays for Fine Pitch Vertical Probing | READ MORE
March 12, 2021
Now Available: Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations | READ MORE
November 26, 2019
Delivering Zero-Defect IC Wafer Test for the Today’s Automotive Market Needs | READ MORE
June 7, 2019
Probe Cards – Online Cleaning Frequency vs. Trade-Offs | READ MORE
March 7, 2019
Validating IC Packaging Requirements for the Connected Car and IoT | READ MORE
February 7, 2019
Four Pyramid Probe Card Cleaning Methods to Avoid | READ MORE
January 24, 2019
Pyramid Probe Cards – 3 Common Questions and Answers | READ MORE
December 20, 2018
Addressing High Parallelism in Production RF Test | READ MORE
November 29, 2018
9 Steps to Determining Online Cleaning Parameters for Pyramid Probe Cards | READ MORE
October 11, 2018
Getting the Most from Pyramid Probe Cards: Training and Certifications | READ MORE
January 25, 2018
Probe Card Cleaning 101 – Protecting Your Probe Card Investment | READ MORE