July 1, 2022
Only Autonomous RF Measurement Assistant enables fully autonomous, hands-free RF calibrations & measurements over multiple temperatures. Featuring the unique Contact Intelligence™ Technology, it reduces cost of test and accelerates time to market with increased accuracy and reduced design cycles.
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February 17, 2022
With a wide range of applications, and upgrade paths to meet any future needs, and with ReAlign Technology, the SUMMIT200 provides the most advanced 200 mm probe station platform for fast, high accuracy and high-volume measurements for existing and future devices and ICs.
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June 17, 2021
The CM300xi-ULN with PureLine 3 Technology eliminates 97% of the environmental noise experienced in previous probe stations and fundamentally transforms the lab flicker noise measurement for leading-edge technology nodes below 7 nanometers.
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March 12, 2021
With a wide range of applications, and upgrade paths to meet any future needs, and now with ReAlign Technology, the SUMMIT200 provides the most advanced 200 mm probe station platform for fast, high accuracy and high-volume measurements for existing and future devices and ICs.
Read MoreSeptember 3, 2020
New Gold Standard for On-Wafer Noise Testing – The CM300xi-ULN Probe Station | READ MORE
June 26, 2020
Introducing the CM300xi-ULN for Flicker Noise (1/f), Random Telegraph Noise (RTN) and Phase Noise Measurements of Ultra-Sensitive Devices | READ MORE
May 28, 2020
Autonomous SiPh Measurement Assistant Delivers Thermal Capability Second to None | READ MORE
May 5, 2020
Working from Home? Meet Our Application Specialists in Our Virtual Demo Lab | READ MORE
April 23, 2020
Edge Coupling Efficiencies for Wafer and Die Level Applications | READ MORE
March 27, 2020
OptoVue Pro – Faster Time to Data with Real-Time In-Situ Calibration | READ MORE
February 20, 2020
Advanced mm-Wave and Terahertz Measurements – Enhanced with Autonomous RF Measurement Assistant | READ MORE
January 23, 2020
Velox 3 Probe Station Control Software – Feature Videos | READ MORE
January 10, 2020
Enabling Unattended Test Over Multiple Temperatures by Automating Thermal Transitions and Probe-to-Pad Alignment | READ MORE
November 1, 2019
Experience the All New Velox 3 Probe Station Control Software | READ MORE
October 24, 2019
New Integrated, Automated Probe Solution for Wafer-level Characterization of 5G Devices and Circuits | READ MORE
October 10, 2019
DC, RF and Optical Probe Positioners for the Highest Accuracy Measurements | READ MORE
September 19, 2019
Advanced mm-Wave and Terahertz Measurements on FormFactor Probe Stations – New Solution and 4 Great Features | READ MORE
August 23, 2019
VueTrack vs. ReAlign – Two Innovative Velox Tools for Unattended Testing Over Time and At Multiple Temperatures | READ MORE
August 8, 2019
CM300xi Probe System – Delivering Measurement Accuracy and Reliability | READ MORE
July 11, 2019
Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures | READ MORE