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WinCal Probe Station Calibration Software

Getting Started with WinCal 5 RF Calibration Software

December 14, 2023

WinCal software serves as a comprehensive and user-friendly tool for calibration, validation, measurement, and analysis, ensuring precise and reproducible on-wafer S-parameters and other VNA-related measurements.

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  • WinCal 5.0 is Here – Attend the Launch Webinar

    WinCal 5.0 is Here – Attend the Launch Webinar

    June 29, 2023

    In recent years, improvements in usability and features have made the software the best-in-class for RF test and measurement. The latest version of WinCal 5.0 builds upon these improvements and offers even more functionality.

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  • Autonomous RF Measurement Assistant with T-Wave Probes and VDI Mini Frequency Extenders on 200 mm Probe Station SUMMIT200

    Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures

    July 1, 2022

    Only Autonomous RF Measurement Assistant enables fully autonomous, hands-free RF calibrations & measurements over multiple temperatures. Featuring the unique Contact Intelligence™ Technology, it reduces cost of test and accelerates time to market with increased accuracy and reduced design cycles.

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  • New Paper: Improving Wafer-Level S-parameters Measurement Accuracy and Stability

    New Paper: Improving Wafer-Level S-parameters Measurement Accuracy and Stability with Probe-Tip Power Calibration up to 110 GHz for 5G Applications

    November 22, 2019

    A new technical paper is now available that presents a novel method of probe-tip power calibration for S-parameters calibration which is shown to greatly improve DC biasing accuracy, S-parameters measurement accuracy and post-calibration stability up to 110 GHz.

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2019

September 19, 2019

Advanced mm-Wave and Terahertz Measurements on FormFactor Probe Stations – New Solution and 4 Great Features | READ MORE

July 11, 2019

Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures | READ MORE

May 23, 2019

3 Tips to Getting the Most from WinCalXE Probe Calibration Software | READ MORE

February 28, 2019

Hybrid Calibration for 4-Port On-wafer Probing | READ MORE

2018

September 27, 2018

Achieving Calibrated Measurement at Frequencies from 140 GHz to 1.1 THz | READ MORE

August 2, 2018

5 Challenges for Probe Tip Sub-THz Measurements | READ MORE

May 11, 2018

Production Test RF Calibration for Multi-DUT Probe Cards: How to Get the Most Accurate Measurements | READ MORE

March 8, 2018

Three Benefits of Using Custom Calibration Substrates | READ MORE

2017

August 17, 2017

Understanding Different On-Wafer Calibration Values with SOLT vs. LRRM | READ MORE