FormFactor will be attending the MEMS & Imaging Sensors Summit on November 14th in Munich, Germany. The MEMS & Imaging Sensors Summit is set to dive into the game-changing impact of MEMS and imaging technologies on connectivity across diverse industries. Attendees will get an inside look at cutting-edge advancements, emerging market trends, and breakthrough applications in AI/ML and data fusion, unlocking a new wave of innovative solutions.

At FormFactor, we provide advanced testing solutions for MEMS sensors, including full wafer testing under varying temperatures, ensuring peak performance and reliability.

Come by Booth 26 and learn more about our products in this space, including:

  • The PMV200 200mm Manual Vacuum Probe System – The PMV200 is a high-precision, manual vacuum probe station designed for testing wafers up to 200 mm in a controlled vacuum environment. Ideal for both industrial and educational settings, it supports a range of applications, including DC, RF, MEMS, and optoelectronic measurements. With optional features like thermal chucks for temperature variation (-60°C to 300°C), it ensures accurate testing in challenging conditions. Its ergonomic design and robust vibration isolation make it perfect for precise, repeatable measurements, particularly for small structures and high-demand environments.
  • The PAV200 200mm Semi-Automated Vacuum Probe System – The PAV200 is a semi-automated probe station designed for testing wafers up to 200 mm in a high-vacuum environment, supporting a range of applications like MEMS, optoelectronics, and RF measurements. It offers exceptional stability with vibration isolation, precise probe positioning, and flexibility for integrating up to eight probe positioners or a probe card. The system can also handle thermal testing with temperature control from -60°C to 300°C. Ideal for advanced research and industrial environments, it enhances efficiency with its user-friendly design and Velox software.
  • The PLV50150mm Manual Vacuum Probe System – The PLV50 is a cost-effective, manual vacuum probe station designed for wafers up to 150 mm, ideal for laboratory environments. It supports a wide range of applications, including DC, RF, MEMS, and optoelectronics testing. With features like precise probe positioning, vibration isolation, and optional thermal chuck control (-60°C to 300°C), it ensures high measurement accuracy. Its ergonomic design and intuitive operation make it suitable for detailed measurements, including under atmospheric conditions with the chamber open. Perfect for researchers needing versatility and precision in vacuum probing environments.
  • The PAP200 200mm Semi-Automated Vacuum and Pressure Probe System – The PAP200 is a semi-automated vacuum and pressure probe station designed for high-precision testing of wafers up to 200 mm in both vacuum and overpressure environments. It supports diverse applications like MEMS, optoelectronics, and RF testing, with the flexibility to integrate up to eight probe positioners or probe cards. It also features an optional thermal chuck for temperature control and advanced automation software, making it ideal for both research and industrial use, ensuring accurate and repeatable measurements.

We hope to see you in Munich!