October 11, 2024
The conference has the perfect mixture of manufacturer and vendor presentations. It is not a sales show, nor an academic or theoretical conference. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas.
FormFactor is excited to announce that we will be attending SWTest Asia at the end of the month.
SWTest Asia
2024 October 24- 26 | Fukuoka, Japan | Hilton Fukuoka Sea Hawk
The premiere SWTest Conference is the only industry conference that focuses on all aspects of semiconductor wafer and die level probe testing. The conference has the perfect mixture of manufacturer and vendor presentations. It is not a sales show, nor an academic or theoretical conference. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas.
This is the first time that SWTest Asia will be held in Japan and FormFactor country manager, Nobuhiro Kawamata will have the honor of being the Japan Program Chair.
We will be at Booth #303 and have 2 Podium Presentations, 1 Poster Session.
Presentation One: October 24th 10:30 – 11:00
Novel True-Kelvin MEMS Analytical DC Probes to enable Accurate and Repeatable Characterization of Advanced-Node devices for AI applications
Choon Beng SIA (FormFactor Inc – Singapore), Masa WATANABE (FormFactor Japan – Japan)
The silicon foundry industry is on track to manufacture GPUs with an astounding 1 trillion transistors by 2030—a tenfold increase from today’s devices—driven by the growing demands of advanced AI applications. Public access to technologies like ChatGPT and other generative AI (GenAI) platforms has been enabled by breakthroughs in machine-learning algorithms, big data availability for neural network training, and energy-efficient computing innovations in semiconductor technology. This rising demand for GenAI continues to push the boundaries of advanced-node GPUs and semiconductor device development.
As we scale gate lengths below 3 nm and explore new architectures like nanosheet transistors, we achieve remarkable gains in power and area efficiency. However, these advancements also pose significant challenges for test engineers. Smaller, aluminum-capped copper test pads—introduced to cut costs in lithography, prototyping, and production—make re-probing the same device with consistently low contact resistance increasingly difficult, especially at high temperatures.
This presentation introduces a novel true-Kelvin MEMS analytical DC probe designed to tackle these challenges. With a precision error margin of just 0.15% on devices with 2-ohm drain-source resistance, it offers nearly error-free measurements through real-time parasitic resistance correction. The probe features a minimal scrub-to-Z over-travel ratio, reducing or eliminating the need for frequent cleaning, and efficiently handles smaller test pads—lowering the overall cost of testing. By enabling highly accurate measurements unaffected by test leads, the true-Kelvin MEMS probe supports the development of precise SPICE models for AI-optimized circuits, paving the way for one-pass design success.
Presentation Two: October 25th 10:30 – 11:00
Quantum Computing IC Die Level Test Solution at mK-temperature Environment
Alan LIAO (FormFactor – USA), Takuji MIKI (Kobe University – Japan)
Cryogenic microelectronics—encompassing Cryo CMOS, superconducting devices, and quantum computing chips based on superconducting and spin qubits—is advancing rapidly, creating new demands for innovative test and measurement solutions in ultra-low-temperature environments. FormFactor’s PQ500 offers a groundbreaking solution as a cryostat-agnostic socket interface, providing high-density RF and DC channel capacity without the need for wire bonding or packaging.
In this presentation, we will highlight a key application of the PQ500 developed in collaboration with Prof. Miki from Kobe University. We will also share electronic characterization data from a typical PQ500 setup, demonstrating its performance in cryogenic conditions. Finally, we will discuss the future development roadmap for the PQ500 and other upcoming solutions from FormFactor aimed at advancing cryogenic testing technologies.
Poster Session
More effective high voltage (1,000V) parametric test technique with MEMS probe card
Takao SAEKI (Formfactor Inc – Japan)
We hope to see you in Japan!