FormFactor and Keysight Technologies now offer a new family of application-specific Integrated Measurement Systems (IMS), sold exclusively by FormFactor. This partnership of industry leaders delivers unmatched capabilities to meet today’s on-wafer test and measurement challenges, with the speed and security of comprehensive, proven solutions. These complete solutions are backed by expertise no other solutions provider can match – experience brought to you by the combination of the worldwide leader in R&D instrumentation and the worldwide leader in analytical probe systems.

These turnkey, on-wafer test solutions include instruments, probe systems, probes, and software, and feature pre-validated packages for many applications, including:

  • S-parameter measurements from kHz to THz, for high-frequency devices including 5G, 6G, automotive radar, imaging, spectroscopy, etc.
  • LIV measurements for silicon photonics devices for data centers and other applications.
  • DC measurements of high-voltage/high-current devices such as GaN, SiC, and IGBT for power conversion and management in electric/hybrid vehicles, renewable energy, smart power grids, air conditioners and industrial motors, and other applications.
  • DC measurements for digital and analog semiconductor devices, including parametric measurements for validation and modeling, circuit characterization, and reliability.
  • 1/f flicker noise, RTN, phase noise, and other low-frequency noise measurements on communications devices and highly-scaled, advanced CMOS nodes.

Watch for more information on these solutions and more. Be sure to bookmark the blog and check out our site.