FormFactor offers a wide selection of engineering probes to meet the highly demanding and broad range of on-wafer and signal integrity applications. Our families of RF, mixed-signal and DC probes are designed to meet the many challenges of the various probing environments and provide a durable, high-performance product that exceeds expectations.

Infinity® Probes

The Infinity Probe is an ideal match for device characterization and modeling applications, with industry-leading performance. The Infinity probe provides unmatched performance in both single-signal and dual-signal (differential) applications, providing extremely low contact resistance on aluminum pads with unsurpassed RF measurement accuracy for highly reliable, repeatable measurements. The Infinity probe is designed for on-wafer/planar surface work only. Proprietary thin-film and coaxial probe technology reduces unwanted coupling to nearby devices and transmission modes.

T-Wave™ Probes

The T-Wave probes enable wafer-level electrical measurement of devices and materials up to 1.1 THz, setting the industry performance standard for characterization of millimeter and sub-millimeter wavelength devices. The T-Wave probes deliver low insertion loss and low contact resistance when probing gold pads.

Air Coplanar Probes

The Air Coplanar Probe (ACP) is a rugged microwave probe with a compliant tip for accurate, repeatable measurements for both on-wafer as well signal integrity applications. It features excellent probe-tip visibility and the lowest loss available. Configurations for both single and dual signal applications are available. The ACP probe combines outstanding electrical performance with precise probe mechanics and is today’s most widely used microwave probe available.

|Z| Probes®

The |Z| Probes assure long probe lifetime and accurate measurements with superior tip compliance. The RF/microwave signal makes only one transition to the coplanar contact structure within the shielded, air-isolated probe body maintaining signal integrity over a temperature range from 10 K to 300°C.

RFIC and Functional Test (multi-contact) Probes

FormFactor offers a variety of durable, high-performance mixed-signal multi-contact probes to streamline RFIC engineering test and production applications up to 110 GHz. The multi-contact probe families include InfinityQuad™ probe, Multi |Z| Probe, Unity Probe™, ACP RF quadrant probe, Eye-Pass® probe, DCQ and WPH probes.

Board Test and Signal Integrity Probes

FormFactor offers precision, durable fine-pitch probes, ideal for signal integrity probing on IC packages and circuit board work. Many of these probes allow for deep reach capabilities to access contacts over adjacent components. Probes are available to meet the performance requirements of both circuit work or material characterization.

Special-purpose RF/microwave Probes

FormFactor offers many custom probes, so if an exact match is not found in this guide, please contact us for a review to determine if we have a probe that will fit your requirements or if we can customize a probe to fit your application. Some example applications/probes are:

  • Impedance matching probes
  • High-performance quadrant probes
  • Cryogenic probes

For probe specifications and recommendations on selecting the right probe for your application, please download our latest Probe Selection Guide or contact a local probe expert that can assist you.