S-Parameter and DC Parametric Measurements
Device characterization requires a suite of measurements in the DC and frequency domains, with flexibility and easily integrated tools which work together seamlessly.
Fully-integrated systems from FormFactor and Keysight Technologies eliminate uncertainty in building up lab capabilities, providing measurement instruments, wafer probers, probes, and software proven to cooperatively deliver data accuracy and correlation.
![measureone-banner-S-Param-DC MeasureOne - S-Parameter & DC Parametric](https://www.formfactor.com/wp-content/uploads/measureone-banner-S-Param-DC.jpg)
MeasureOne Benefits Include
- Best-of-breed, high-performance tools from industry leaders FormFactor and Keysight Technologies
- Configured and optimized to deliver accurate, repeatable, and automated on-wafer S-Parameter & DC Parametric measurements
![FormFactor, Inc. FormFactor, Inc.](https://www.formfactor.com/wp-content/uploads/ffi-logo.png)
![keysight-partner-logo Keysight Premium Solutions Partner](https://www.formfactor.com/wp-content/uploads/keysight-partner-logo.png)
Solution Components Include
- Cascade 200 mm or 300 mm semi-automated probe system, WinCal calibration software, Infinity Probes, and ISS calibration standards
- Keysight Technologies PNA or PNA-X, B1500A, WaferPro-XP, IC-CAP software, and DC Power Analyzer
- Now available as an mmW/THz Integrated Measurement System and a DC Integrated Measurement System – comprehensive, turn-key, all-in-one FormFactor + Keysight solutions at no additional cost!