FormFactor will be attending the SPIE Defense + Commercial Sensing conference, April 21 – April 25, in National Harbor, Maryland. At the show – Booth #327 – we’ll be featuring our wafer test solutions for IR sensors, which include the PLC50, the PMC200, and the PAC200.

PLC50 – 100 mm manual cryogenic probe system

The PLC50 probe system is the most cost-effective and simple, yet highly-precise probing solution for wafers and substrates up to 80 mm at cryogenic temperatures. Specially designed for laboratory requirements, it supports a wide range of applications, including I-V, C-V and RF, and can be used for probing down to 77 K with liquid nitrogen or <7 K with liquid helium. Application flexibility is ensured for DC and RF measurements of the latest silicon, compound semiconductor and superconductor devices.

PMC200 – 200 mm manual cryogenic probe system

The PMC200 probe system is the ideal solution for testing wafers and substrates up to 200 mm in a high vacuum, cryogenic environment. Specially designed for laboratory requirements, it supports a wide range of measurements, including I-V, C-V and RF, and can be used for probing down to 77 K with liquid nitrogen or <7 K with liquid helium. Application flexibility is ensured for DC and RF measurements of the latest silicon, compound semiconductor and superconductor devices.

PAC200 – 200 mm semi-automated cryogenic probe system

The Cascade PAC200 probe system is the ideal solution for automatic testing of wafers and substrates up to 200 mm (with a 300 mm option) in a high vacuum, cryogenic environment down to 77 K with liquid nitrogen or below 10 K with liquid helium. Dry-cooling options are also available. Similar to the PMC200, it supports a wide range of applications, including DC and RF measurements of the latest silicon, compound semiconductor and superconductor devices.

These high-performance cryogenic probe stations for on-wafer and multi-chip measurements support a wide range of challenging applications – including IR-sensor test. The needed adaptations for the target test temperature, the device stimulation, and measurement accuracy are implemented and established as field-proven solutions.

You can see more on the PAC200 Fully-Automated Cryogenic Probe Station with Loader in the video below.

Hope to see you in Maryland!