• Version
• Download 8206
• File Size 340.41 KB
• File Count 1
• Create Date February 3, 2022
• Last Updated February 3, 2022

HFTAP Series Probe Card Data Sheet

The industry-leading performance of the HFTAP K32 product joins FormFactor's series of High Frequency Test probe cards, including the K10 and K16 and K22 used for testing 1.0 GHz, 1.6 GHz, and 2.2 GHz. Advanced PCB technology, exclusively available from FormFactor, allows the fastest communication between the Device Under Test (DUT) and Automated Test Equipment (ATE). By utilizing FormFactor's Matrix architecture, HFTAP K32 probe cards can test speeds that no other full wafer contactor can achieve.

Attached Files