Enhanced platform increases test cell efficiency for advanced 300-mm Flash wafers

LIVERMORE, Calif. – February 9, 2009 – FormFactor, Inc. (Nasdaq: FORM) today introduced the newest addition to its suite of advanced full-wafer contact probe cards for NAND and NOR Flash memory 300-mm wafer testing—the Harmony OneTouchTM ATC probe
solution. Leveraging many of the architectural enhancements recently introduced on the Harmony eXPTM platform for DRAM wafer testing, the Harmony OneTouch ATC card enables Flash device manufacturers to lower their test costs on their leading-edge Flash products through increased wafer test productivity and improved test yields.

The Harmony OneTouch ATC card supports the company’s RapidSoakTM technology, which leverages advanced temperature control to reduce the time required for the probe card to achieve thermal equilibrium by as much as 50 percent—resulting in increased test cell productivity and uptime. In addition, RapidSoak technology improves the scrub consistency of the Harmony OneTouch ATC probe card by compensating for temperature variation related to wafer chuck movements.

The Harmony OneTouch ATC platform with RapidSoak has been qualified at Hynix Semiconductor Inc. to test sub 50nm Flash devices. The platform is designed to accommodate the testing of Flash devices of various densities, ranging from 128MB NOR devices up to and including 64GB NAND devices.

“To maintain our position as a world-class semiconductor manufacturer and one of the world’s leading NAND Flash producers requires both technology leadership and cost-efficient manufacturing,” stated Sr. Manager, BW Kang, Hynix Semiconductor Inc. “Having access to the latest wafer probe card technologies helps us to assure the quality of our most advanced NAND devices and increase test productivity.”

Harmony OneTouch ATC provides superior planarity over FormFactor’s previous-generation Harmony OneTouch platform, by as much as 25 percent in some customer-specific configurations. X/Y placement accuracy has also improved significantly, offering high accuracy at both hot and cold test insertions using the same probe card.

“Flash memory suppliers are under extreme pressure as the industry works through today’s difficult economic challenges,” stated Adrian Wilson, general manager of FormFactor’s Flash product business unit. “FormFactor is committed to helping customers reduce their cost of test—not just in the short term, but on a sustainable basis. Our investment in innovation and R&D enables us to deliver mission critical products, like the Harmony OneTouch ATC, which are designed to significantly reduce overall test time, thereby improving test floor efficiency and lowering overall test costs.”

Harmony OneTouch ATC probe cards are now available for ordering and shipping.

Forward-Looking Statements

Statements in this press release that are not strictly historical in nature are forward-looking statements within the meaning of the federal securities laws, including results the company’s customers’ might realize when using the company’s products, demand for the company’s products and future growth. These forward-looking statements are based on current information and expectations that are inherently subject to change and involve a number of risks and uncertainties. Actual events or results might differ materially from those in any forward-looking statement due to various factors, including, but not limited to: the company’s ability to lower customers’ test costs and improve their test yields on leading-edge Flash memory devices, to support customers’ cost and test technology roadmaps as they transition to sub 50nm Flash device geometries; to increase customers’ wafer test productivity and improve their test yields, to deliver products that increase customers’ test cell productivity and uptime, to continuously provide tighter planarity products, to improve X/Y placement accuracy at both hot and cold test temperature environments, and the company’s ability to support its RapidSoak technology within the Harmony OneTouch ATC platform and maintain thermal stability and improve scrub consistency, and reduce the time required for the probe card to achieve thermal equilibrium. Additional information concerning factors that could cause actual events or results to differ materially from those in any forward-looking statement is contained in the company’s Form 10-K for the fiscal year ended December 29, 2007 and the company’s Form 10-Q reports for its fiscal quarters within 2008, filed with the Securities and Exchange Commission (“SEC”), and subsequent SEC filings. Copies of the company’s SEC filings are available at http://investors.formfactor.com/edgar.cfm. The company assumes no obligation to update the information in this press release, to revise any forward-looking statements or to update the reasons actual results could differ materially from those anticipated in forward-looking statements.