VueTrack technology for unattended testing over multiple temperatures

FormFactor’s VueTrack technology, new on-site PTPA error correction method, dramatically increases the productivity of analytical probers in test labs, by enhancing contact reliability and automating PTPA error correction. The new on-site PTPA approach utilizes a single downward-looking microscope to measure the probe tips and wafer locations with the chuck in the same position that the electrical measurement (or probe contact) will be made. On-site probe tip and wafer location measurements enable the best possible alignment to be maintained throughout a wafer test plan.

Created: August 18, 2017 | Updated: March 14, 2019 | Type: pdf | Size: 1.32 MB

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