2D MEMS Probe to Parametric Testing and Other Probe Technology

FormFactor’s Takao Saeki unveils Takumi CL, a new low-impact parametric MEMS probe card for low-leakage and small pad size applications. Featuring a new 2D MEMS spring and contact tip, the Takumi CL offers a consistent small scrub mark over the life of the product, with the benefits of low cost and fast manufacturing lead time.

- 2D MEMS Probe to Parametric Testing and Other Probe Technology

Created: November 5, 2019 | Updated: June 25, 2020 | Type: pdf | Size: 1.39 MB