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DCP 100 Probe
  • DCP 100 Probe

The DCP100 delivers the measurement accuracy needed for advanced on-wafer process, device characterization and reliability testing. With superior guarding and shielding, these probes overcome the performance limitations of non-coaxial needle probes. They are integrally designed as part of a complete measurement solution, these probes are highly reliable, stable and repeatable.

Advantages

  • Ultra-low, fA and fF measurements from -65 º C to 150 º C
  • Full electrical guard to the probe tip
  • Integrally designed as part of Cascade’s complete measurement solution
  • Highly reliable, stable and repeatable

  • High-quality construction with low-noise electrical performance
  • Kelvin version for convenient 4-point measurements
  • Replaceable coaxial probe tips, with choice of tip radii, and full electrical guard to the probe tip
  • SSMC 50 connectors
  • Ultra-low, fA and fF measurements from -65 º C to 150 º C